Patrick Hole, Malvern, has lately given two talks that discussed this technical note:


1) Using Nanoparticle Tracking Analysis (NTA) for Accurate and Complete Nanosuspension Characterisation, Clinam, Basel, Switzerland, 28 June – 1 July 2015 (https://www.clinam.org/)


2) Improving repeatability and reproducibility of size and concentration measurements using nanoparticle tracking analysis, QualityNano Conference and Training Workshop, Heraklion, Greece, 15 – 17 July 2015 (http://www.qualitynano.eu/conference/welcome.html)


View the Technical Note >>